Authors
Xiaoming Gou
School of Information and Electronics Beijing Institute of Technology, Beijing, China
Zhiwen Liu
School of Information and Electronics Beijing Institute of Technology, Beijing, China
Wei Liu
Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield
Yougen Xu
School of Information and Electronics Beijing Institute of Technology, Beijing, China
Jiabin Wang
Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield