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Application of Digital Filters to Check Quality of the Automatically Scaled Ionograms Cover

Application of Digital Filters to Check Quality of the Automatically Scaled Ionograms

Journal of Electrical Engineering
Volume 66 (2015): Issue 3 (May 2015)
By: Luboš Rejfek,  Zbyšek Mošna,  Daniel Kouba,  Josef Boška and  Dalia Burešová  
Open Access
|Jul 2015
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DOI: https://doi.org/10.2478/jee-2015-0026 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 164 - 168
Submitted on: Dec 17, 2014
Published on: Jul 14, 2015
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
ionogram,
F2 layer,
critical frequency,
virtual height,
total electron content,
finite impulse response filter
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2015 Luboš Rejfek, Zbyšek Mošna, Daniel Kouba, Josef Boška, Dalia Burešová, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 66 (2015): Issue 3 (May 2015)
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