Authors
Roman Kosenko
Student Member, IEEE, Chernihiv State University of Technology,, Chernihiv, Ukraine
Andrei Blinov
Member, IEEE, Tallinn University of Technology,, Tallinn, Estonia
Dmitri Vinnikov
Senior Member, IEEE, Tallinn University of Technology,, Tallinn, Estonia
Andrii Chub
Member, IEEE, Chernihiv State Technological University,, Chernihiv, Ukraine