Abstract
Diffraction techniques and methods with X-rays and less diffraction of electrons, neutrons, etc. are frequently used to investigate the fine structure. X-ray techniques have the advantage that they are cheaper and provide statistical information at the level of fine ordered structure and are not significantly disturbed by the magnetic state of the substance. But the experimental reality complicates matters. The geometric divergence (vertical and horizontal) of the incident beam, the deviation from the ideal monochromatism and the diffraction geometry induce certain corrections for the expression of the integral diffraction intensity. This article addresses the calculation of the integral diffraction intensity affected by these factors for certain methods of X-ray structural analysis.