References
- Belous V., Inventor’s Handbook (in Romanian). Technical Publishing House, Bucharest, 1990.
- Chase E.W., DeRosa F., Dugan M.P., Unger B.A., Rapid Temperature Cycling for Accelerated Stress Testng, U.S. Patent 5,318,361/1994.
- Constantino N., Design and Testing of Electronic Devices for Harsh Environments, Doctoral Thesis, Università di Pisa, 2013.
- Electronic Cooling. Electronic Performance Impact of Elevated Humidity Environments – Implications for Free Air Cooling of Data Centers, 2013, available from https://www.electronics-cooling.com/2013/06/electronic-performance-impact-of-elevated-humidity-environments-implications-for-free-air-cooling-of-data-centers/, accessed: 30.10.2021.
- Espinet F., Joumblatt D., Rossi D., Framework, Models and Controlled Experiments for Network Troubleshooting, Computer Networks, 107, 36-54 (2016).
- Flicker J., Tamizhmani G., Moorthy M.K., Thiagarajan, R., Ayyanar, R., Accelerated Lifetime Testing of Module Level Power Electronics for Long-Term Reliability, SAND2016-7976J, available from https://www.osti.gov/pages/servlets/purl/1333376, accessed: 30.10.2021.
- Gunn J.E., Highly Accelerated Temperature and Humidity Stress Test Technique (HAST), 19th International Reliability Physics Symposium IRPS, 7-9 April 1981, 48-51.10.1109/IRPS.1981.362972
- Leng G.W., Teen L.K., ESPCRM - An Expert System for Personal Computer Repair and Maintenance, Engineering Applications of Artificial Intelligence, 5, 2, 121-133 (1992).
- Slătineanu L., Fundamentals of the Scientific Research (in Romanian), Publishing House PIM, Iași, 2019.
- What Is System Testing – A Ultimate Beginner’s Guide, 2021, available at https://www.softwaretestinghelp.com/system-testing/, accessed: 30.10.2021.