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There is no Flaw in Neuhaus and Jewell (1993) Cover

There is no Flaw in Neuhaus and Jewell (1993)

Open Access
|Jun 2025

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DOI: https://doi.org/10.2478/bile-2025-0006 | Journal eISSN: 2199-577X | Journal ISSN: 1896-3811
Language: English
Page range: 101 - 105
Published on: Jun 30, 2025
Published by: Polish Biometric Society
In partnership with: Paradigm Publishing Services
Publication frequency: 2 issues per year

© 2025 John Neuhaus, Nicholas P. Jewell, published by Polish Biometric Society
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.