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Computing analytic Bayes factors from summary statistics in repeated-measures designs Cover

Computing analytic Bayes factors from summary statistics in repeated-measures designs

Open Access
|Jun 2023

Metrics

DOI: https://doi.org/10.2478/bile-2023-0001 | Journal eISSN: 2199-577X | Journal ISSN: 1896-3811
Language: English
Page range: 1 - 21
Published on: Jun 28, 2023
Published by: Polish Biometric Society
In partnership with: Paradigm Publishing Services
Publication frequency: 2 issues per year

© 2023 Thomas J. Faulkenberry, Keelyn B. Brennan, published by Polish Biometric Society
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.