Authors
C. M. Franck
High-Voltage Laboratory, Swiss Federal Institute of Technology Zurich (ETHZ), Zurich, Switzerland
J. Engelbrecht
High-Voltage Laboratory, Swiss Federal Institute of Technology Zurich (ETHZ), Zurich, Switzerland
M. Muratović
High-Voltage Laboratory, Swiss Federal Institute of Technology Zurich (ETHZ), Zurich, Switzerland
P. Pietrzak
High-Voltage Laboratory, Swiss Federal Institute of Technology Zurich (ETHZ), Zurich, Switzerland
P. Simka
High-Voltage Laboratory, Swiss Federal Institute of Technology Zurich (ETHZ), Zurich, Switzerland