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A method to determine the parameters of the double layer of a planar interdigital sensor Cover

A method to determine the parameters of the double layer of a planar interdigital sensor

International Journal on Smart Sensing and Intelligent Systems
Volume 7 (2014): Issue 5 (January 2014)
By: Thanh-Tuan Ngo,  Hamidreza Shirzadfar,  Ayoub Bourjilat,  Djilali Kourtiche and  Mustapha Nadi  
Open Access
|Feb 2020

Authors

Thanh-Tuan Ngo

Université de Lorraine - CNRS, Nancy, France

Hamidreza Shirzadfar

Université de Lorraine - CNRS, Nancy, France

Ayoub Bourjilat

Université de Lorraine - CNRS, Nancy, France

Djilali Kourtiche

djilali.kourtiche@univ-lorraine.fr

Université de Lorraine - CNRS, Nancy, France

Mustapha Nadi

Université de Lorraine - CNRS, Nancy, France
DOI: https://doi.org/10.21307/ijssis-2019-080 | Journal eISSN: 1178-5608
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Language: English
Page range: 1 - 4
Published on: Feb 15, 2020
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
Keywords:
relative permittivity,
interdigital sensor,
double layer,
thickness,
capacitance
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2020 Thanh-Tuan Ngo, Hamidreza Shirzadfar, Ayoub Bourjilat, Djilali Kourtiche, Mustapha Nadi, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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