Acoustic emission testing of electrical stressed copper trace
Authors
Daniela Florian
Institute for Measurement Technology Johannes Kepler University, Linz, Austria
Thomas Wiesner
Institute for Measurement Technology Johannes Kepler University, Linz, Austria
Bernhard G. Zagar
Institute for Measurement Technology Johannes Kepler University, Linz, Austria
DOI: https://doi.org/10.21307/ijssis-2019-068 | Journal eISSN: 1178-5608
Language: English
Page range: 1 - 6
Published on: Feb 15, 2020
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 times per year
Related subjects:
© 2020 Daniela Florian, Thomas Wiesner, Bernhard G. Zagar, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.