Authors
John Jendzurski
National Institute of Standards and Technology Gaithersburg, Gaithersburg, USA
Nicholas G. Paulter
National Institute of Standards and Technology Gaithersburg, Gaithersburg, USA
Eddie Jacosb
University of Memphis, Memphis, USA
Francine Amon
SP Technical Research Institute of Sweden Borås, Borås, Sweden
Al Bovik
University of Texas at Austin, Austin, USA
Todd Goodall
University of Texas at Austin, Austin, USA