Authors
Maciej Trawka
Department of Metrology and Optoelectronics Faculty of ETI, Gdansk University of Technology Gdansk, Gdansk, Poland
Janusz Smulko
Department of Metrology and Optoelectronics Faculty of ETI, Gdansk University of Technology Gdansk, Gdansk, Poland
Lech Hasse
Claes G. Granqvist
Department of Engineering Sciences The Ångström Laboratory, Uppsala University Uppsala, Uppsala, Sweden
Radu Ionescu
Department of Electronics Rovira i Virgily University Tarragona, Tarragona, Spain
Fatima E. Annanouch
Department of Electronics Rovira i Virgily University Tarragona, Tarragona, Spain
Eduard Llobet ETSE-DEEEA
Department of Electronics Rovira i Virgily University Tarragona, Tarragona, Spain
Laszlo B. Kish
Department of Electrical & Computer Engineering Texas A&M University Texas, Texas, USA