Magnetic and Transport properties of Co-Cu Microwires

V. Zhukova; J. J. del Val; M. Ipatov; M. Ilyn; A. Granovsky; A. Zhukov

doi:10.21307/ijssis-2019-024

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Magnetic and Transport properties of Co-Cu Microwires

International Journal on Smart Sensing and Intelligent Systems

Volume 7 (2014): Issue 5 (January 2014)

By: V. Zhukova, J. J. del Val, M. Ipatov, M. Ilyn, A. Granovsky and A. Zhukov

Open Access

|Feb 2020

Abstract

We report on the magnetic, transport and structural properties of Cox-Cu100-x (5≤x≤40) glass-coated microwires. For x=5 we observed the resistivity minimum at 40 K associated with the Kondo effect. For x ? 10 we observed considerable magnetoresistance effect. Temperature dependence of susceptibility show considerable difference for x>10 and x≤ 10 attributed to the presence of small Co grains embedded in the Cu matrix for x? 10. Using X-ray diffraction we found, that the structure of Cox-Cu100-x microwires x ? 10 is granular consisting of two phases: fcc Cu appearing in all the samples and fcc α-Co presented only in microwires with higher Co content.

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DOI: https://doi.org/10.21307/ijssis-2019-024 | Journal eISSN: 1178-5608

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© 2020 V. Zhukova, J. J. del Val, M. Ipatov, M. Ilyn, A. Granovsky, A. Zhukov, published by International Journal on Smart Sensing and Intelligent Systems
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Volume 7 (2014): Issue 5 (January 2014)