Authors
Hongmin Li
College of Physical and Electronic Engineering, Hunan Institute of Science and Technology, Yueyang, China
College of Electrical and Automation Engineering, Hefei University of Technology, Hefei, China
Yigang He
College of Electrical and Automation Engineering, Hefei University of Technology, Hefei, China
Yichuang Sun
School of Electronic, Communication and Electrical Eng., University of Hertfordshire, Hatfield, UK