Authors
ChengFang Zhen
School of 1The College of the Computer and Automatic technology, North University of China, TaiYuan, PR China
Dept. of computer Science, The University of Alabama, Tuscaloosa, USA
Wenyi LIU
Key Laboratory of Instrumentation Science & Dynamic Measurement, North University of China, Ministry of Education, TaiYuan, PR China
Hanming WEI
Key Laboratory of Instrumentation Science & Dynamic Measurement, North University of China, Ministry of Education, TaiYuan, PR China