Authors
Yi Zhao
School of Electronics and Control Engineering, Chang’An University, Xi’an, China
Laboratoire PROTEE, Université de Toulon, Toulon, France
Valentin Gies
Laboratoire PROTEE, Université de Toulon, Toulon, France
Jean-Marc Ginoux
CNRS, LSIS, Toulon, France
Aix Marseille Université, CNRS, ENSAM, LSIS, Toulon, France