Authors
Guohui Wu
Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong University, Hangkong, China
Xingkun Li
Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong University, Hangkong, China
Jiyang Dai
Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong University, Hangkong, China