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By:
Open Access
|Dec 2017

Authors

Guohui Wu

nchu_ghwu@163.com

Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong University, Hangkong, China

Xingkun Li

lxingkun@163.com

Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong University, Hangkong, China

Jiyang Dai

djiyang@163.com

Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong University, Hangkong, China
Language: English
Page range: 724 - 739
Submitted on: Feb 6, 2014
Accepted on: Jun 1, 2014
Published on: Dec 27, 2017
Published by: Professor Subhas Chandra Mukhopadhyay
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year

© 2017 Guohui Wu, Xingkun Li, Jiyang Dai, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.