One-Shot Three-Dimensional Surface Profilometry using DMD-Based Two-Frequency Moiré and Fourier Transform Technique Cover

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One-Shot Three-Dimensional Surface Profilometry using DMD-Based Two-Frequency Moiré and Fourier Transform Technique

International Journal on Smart Sensing and Intelligent Systems

Volume 2 (2009): Issue 3 (January 2009)

By: L. C. Chen, C. H. Cho and X. L. Nguyen

Open Access

|Nov 2017

Authors

L. C. Chen

Graduate Institute of Automation Technology, National Taipei University of Technology, Taipei, Taiwan

C. H. Cho

Graduate Institute of Automation Technology, National Taipei University of Technology, Taipei, Taiwan

X. L. Nguyen

lcchen@ntut.edu.tw

Graduate Institute of Automation Technology, National Taipei University of Technology, Taipei, Taiwan

DOI: https://doi.org/10.21307/ijssis-2017-355 | Journal eISSN: 1178-5608

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Language: English

Page range: 345 - 380

Published on: Nov 3, 2017

Published by: Professor Subhas Chandra Mukhopadhyay

In partnership with: Paradigm Publishing Services

Publication frequency: 1 issue per year

Keywords:

Optical metrology,

Automatic optical inspection (AOI),

Fourier transform,

Surface profilometry,

Fourier transform profilometry (FTP),

Dynamic measurement

Related subjects:

Introductions and overviews,

Engineering, other

© 2017 L. C. Chen, C. H. Cho, X. L. Nguyen, published by Professor Subhas Chandra Mukhopadhyay
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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