Intelligent Structural Elements Covered By Piezoelectric High-Polymer Film
By: Eiji Matsumoto and Yuji Komagome
Abstract
If a piezoelectric material is deformed, the local electric field is caused by the electromechanical interaction. When a structural element with surface defects is subjected to the stress, the strain distribution appears also on the opposite surface to the defects. Such localized strain distribution can be measured by the electric potential distribution on a piezoelectric film mounted on the smooth surface. This paper shows that back-surface defects in typical structural elements can be visualized by mounted PVDF thin film
DOI: https://doi.org/10.21307/ijssis-2017-298 | Journal eISSN: 1178-5608
Language: English
Page range: 420 - 429
Published on: Dec 13, 2017
Published by: Macquarie University, Australia
In partnership with: Paradigm Publishing Services
Publication frequency: 1 issue per year
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© 2017 Eiji Matsumoto, Yuji Komagome, published by Macquarie University, Australia
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.