Authors
Fakhreddine Karray
Pattern Analysis and Machine Intelligence Lab., Department of Electrical and Computer Engineering University of Waterloo, Waterloo, Canada
Milad Alemzadeh
Pattern Analysis and Machine Intelligence Lab., Department of Electrical and Computer Engineering University of Waterloo, Waterloo, Canada
Jamil Abou Saleh
Pattern Analysis and Machine Intelligence Lab., Department of Electrical and Computer Engineering University of Waterloo, Waterloo, Canada
Mo Nours Arab
Pattern Analysis and Machine Intelligence Lab., Department of Electrical and Computer Engineering University of Waterloo, Waterloo, Canada