Authors
Qingyu Zou
College of Electrical and Information Engineering, Beihua University, Jilin, China
Jianwen Guan
College of Electrical and Information Engineering, Beihua University, Jilin, China
Jing Bai
College of Electrical and Information Engineering, Beihua University, Jilin, China
Weiliang Sun
College of Electrical and Information Engineering, Beihua University, Jilin, China