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DOI: https://doi.org/10.21061/jte.v14i2.a.3 | Journal eISSN: 1045-1064
Language: English
Page range: 28 - 39
Published on: Mar 22, 2003
Published by: Virginia Tech
In partnership with: Paradigm Publishing Services
© 2003 Kurt Seemann, published by Virginia Tech
This work is licensed under the Creative Commons License.
