The threshold contrast thickness evaluated with different CDMAM phantoms and software
By: Ewa Fabiszewska, Iwona Grabska and Katarzyna Pasicz
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DOI: https://doi.org/10.1515/nuka-2016-0004 | Journal eISSN: 1508-5791 (formerly 0029-5922) | Journal ISSN: 0029-5922
Language: English
Page range: 53 - 59
Submitted on: Jun 18, 2014
Accepted on: Aug 17, 2015
Published on: Mar 17, 2016
Published by: Institute of Nuclear Chemistry and Technology
In partnership with: Paradigm Publishing Services
Keywords:
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© 2016 Ewa Fabiszewska, Iwona Grabska, Katarzyna Pasicz, published by Institute of Nuclear Chemistry and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.