The detection of reverse accumulation effect in the positron annihilation profile of stack of aluminum and silver foils
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References
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- 2. Dryzek, J., & Siemek, K. (2013). The accumulation effect of positrons in the stack of foils, detected by measurements of the positron implantation profile. J. Appl. Phys., 114, 224901–224906. DOI: 10.1063/1.4843035.
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Language: English
Page range: 713 - 716
Submitted on: Jun 18, 2015
Accepted on: Aug 13, 2015
Published on: Dec 1, 2015
Published by: Institute of Nuclear Chemistry and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2015 Jerzy Dryzek, Krzysztof Siemek, published by Institute of Nuclear Chemistry and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.