Studies of field emission process influence on changes in CNT films with different CNT superficial density
References
- [1] GRONING P., RUFFIEUX P., SCHLAPBACH L., GRONING O., Adv. Eng. Mater., 5 (2003), 541.
- [2] BONARD J.M., CROCI M., ARFAOUI I., NOURY O., SARANGI D., CHATELAIN A., Diam. Relat. Mater., 11 (2002), 763.
- [3] NILSSON L., GROENING O., EMMENEGGER C., KUETTEL O., SCHALLER E., SCHLAPBACH L., KIND H., BONARD J-M., KERN K., Appl. Phys. Lett., 76 (15) (2000), 2071.
- [4] WANGA X.Q., WANGA M., LIB Z.H., XUA Y.B., HE P.M., Ultramicroscopy, 102 (2005), 181.
- [5] FILIP V., NICOLAESCU D., TANEMURA M., OKUYAMA F., Ultramicroscopy, 89 (2001), 39.
- [6] JONGE N., DRUTEN N.J., Ultramicroscopy, 95 (2003), 85.
- [7] NAKAHARA H.ET AL., Appl. Surf. Sci., 256 (2009), 1214.
- [8] WANG Q. H. ET AL., Appl. Phys. Lett., 72 (22) (1998), 2912.
- [9] JONGE J., BONARD J.M., Phil. Trans. R. Soc. London A, 362 (2004), 2239.
- [10] WANG Z.L., PONCHARAL P., DE HEER W.A., Appl. Phys. Lett., 80 (2002), 856.
- [11] WEI Y.Y., DEAN K.A., COLL B.F., JASKIE J.E., Appl. Phys. Lett., 79 (2001), 4527.
- [12] WANG Q.H., YAN M., CHANG R. P.H., Appl. Phys. Lett., 78 (2001), 1294.
- [13] BONARD J.M., KLINKE C.K., DEAN K., COLL B., Phys Rev. B, 67 (2003), 115406.
- [14] YUE G.Z. ET AL., Appl. Phys. Lett., 81 (2) (2002), 355.
- [15] SARRAZIN P. ET AL., Adv X ray Anal., 47 (2004), 232.
- [16] READ M.E., 2001 Particle Accelerator Conference, (2001), 1026.
- [17] BONARD, J.M.; KIND, H., STÖCKLI, T.H. ET AL., Solid State Electronics, 45 (2001), 893.
- [18] SAITO Y., UEMURA S., HAMAGUCHI K., Jpn J. Appl. Phys., 37 (1998) L346.
- [19] CZERWOSZ E., BIERNACKI K., ST ˛ EPI´NSKA I., RYMARCZYK J., RZEPKA E., WASZUK S., WÓDKA T., WRONKA H., Cold cathode lighting, in: CZERWOSZ E. (Ed.), Vacuum Technique & Technology, Monographs of Tele & Radio Research Institute, Warsaw, 2014, p. 169.
- [20] KOZŁOWSKI M., ST ˛ EPI´NSKA I., SOBCZAK K., CZERWOSZ E., Proc. SPIE, 9662 (2015), 96624G-1.
- [21] ST ˛ EPI´N SKA I., KOZŁOWSKI M., RADOMSKA J., WRONKA H., CZERWOSZ E., Mater. Sci.-Poland, 33 (1) (2015), 36.
- [22] ST ˛ EPI´N SKA I., CZERWOSZ E., WRONKA H., KOZŁOWSKI M., Proc. SPIE, 8008 (2011), 800820-1.
- [23] ST ˛ EPI´N SKA I., KOZŁOWSKI M., SOBCZAK K., Elektronika, 8 (2012), 98.
- [24] CZERWOSZ E., IWANEJKO I., KAMINSKA A., RYMARCZYK J., KECZKOWSKA J., SUCHANSKA M., CRACIUNOIU F., COMANESCU F., IEEE CAS 2010 Proc. (International Semiconductor Conference), 1 (2010), 91.
Language: English
Page range: 27 - 33
Submitted on: Jan 9, 2017
Accepted on: Jan 12, 2018
Published on: May 18, 2018
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2018 Izabela Stępińska, Elżbieta Czerwosz, Mirosław Kozłowski, Halina Wronka, Piotr Dłużewski, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.