Investigation of dielectric properties of heterostructures based on ZnO structures

A.H. Selçuk; E. Orhan; S. Bilge Ocak; A.B. Selçuk; U. Gökmen

doi:10.1515/msp-2017-0108

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Investigation of dielectric properties of heterostructures based on ZnO structures

Materials Science-Poland

Volume 35 (2017): Issue 4 (December 2017)

By: A.H. Selçuk, E. Orhan, S. Bilge Ocak, A.B. Selçuk and U. Gökmen

Open Access

|Mar 2018

Abstract

The voltage and frequency dependence of dielectric constant є′, dielectric loss є″, electrical modulus M″, M′, loss tangent tanδ and AC electrical conductivity σ_AC of p-Si/ZnO/PMMA/Al, p-Si/ZnO/Al and p-Si/PMMA/Al structures have been investigated by means of experimental G-V and C-V measurements at 30 kHz, 100kHz, 500 kHz and 1 MHz in this work. While the values of є′, є″, tanδ and σ_AC decreased, the values of M′ and M″ increased for these structures when frequency was increased and those of p-Si/ZnO/Al and p-Si/PMMA/Al were comparable with those of p-Si/ZnO/PMMA/Al. The obtained results showed that the values of p-Si/ZnO/PMMA/Al structure were lower than the values of p-Si/ZnO/Al and p-Si/PMMA/Al.

References

[1] SHIN B.K., LEE T.I., XIONG J., HWANG C., NOH G., CHO J.H., MYOUNG J.M., Sol. Energ. Mat. Sol. C., 95 (2011), 2650.10.1016/j.solmat.2011.05.033
Search in Google Scholar Back to article
[2] OOTSUKA T., LIU Z., OSAMURA M., FUKUZAWA Y., KURODA R., SUZUKI Y., OTOGAWA N., MISE T., WANG S., HOSHINO Y., NAKAYAMA Y., TANOUE H., MAKITA Y., Thin Solid Films, 476 (2005), 30.10.1016/j.tsf.2004.06.145
Search in Google Scholar Back to article
[3] SZARKO J.M., SONG J.K., BLACKLEDGE C.W., SWART I., LEONE S.R., LI S., ZHAO Y., Chem. Phys. Lett., 404 (2005), 171.10.1016/j.cplett.2005.01.063
Search in Google Scholar Back to article
[4] ASMAR AL R., ATANAS J.P., AJAKA M., ZAATAR Y., FERBLANTIER G., SAUVAJOL J.L., JABBOUR J., JUILLAGET S., FOUCARAN A., J. Cryst. Growth, 279 (2005), 394.10.1016/j.jcrysgro.2005.02.035
Search in Google Scholar Back to article
[5] BARNES T.M., LEAF J., HAND S., FRY C., WOLDEN C.A., J. Cryst. Growth, 274 (2004), 412.10.1016/j.jcrysgro.2004.10.015
Search in Google Scholar Back to article
[6] CHEN S., ZHANG J., FENG X., WANG X., LUO L., SHI Y., XUE Q., WANG C., ZHU J., ZHU Z., Appl. Surf. Sci., 241 (2005), 384.
Search in Google Scholar Back to article
[7] AYOUCHI R., LEINEN D., MARTIN F., GABAS M., DALCHIELE E., RAMOS-BARRADO J.R., Thin Solid Films, 426 (2003), 68.10.1016/S0040-6090(02)01331-7
Search in Google Scholar Back to article
[8] CHAABOUNI F., ABAAB M., REZIG B., Superlattice. Microst., 39 (2006), 171.10.1016/j.spmi.2005.08.070
Search in Google Scholar Back to article
[9] SELIM OCAK Y., J. Alloy. Compd., 513 (2012), 130.10.1016/j.jallcom.2011.10.005
Search in Google Scholar Back to article
[10] KOIDE Y., Appl. Surf. Sci., 254 (2008), 6268.10.1016/j.apsusc.2008.02.157
Search in Google Scholar Back to article
[11] CAPUTO D., CESARE DE D., NASCETT A., TUCCI M., Sensor. Actuat. A-Phys., 153 (2009), 1.10.1016/j.sna.2009.04.017
Search in Google Scholar Back to article
[12] GRAMSCH E., PCHELYAKOV O.P., CHISTOKHIN I. B., THISHKOVSKY G., IEE T. Electron. Dev., 54 (2007), 2638.10.1109/TED.2007.904829
Search in Google Scholar Back to article
[13] JIN Y., WANG J., SUN B., BLAKESLEY J.C., GREENHAM N.C., Nano Lett., 8 (2008), 1649.10.1021/nl0803702
Search in Google Scholar Back to article
[14] ZHAI T., FANG X., LIAO M., XU X., LIANG LI., LIU B., KOIDE Y., MA Y., YAO J., BANDO Y., GOLBERG D., ACS Nano., 4 (2010), 1596.10.1021/nn9012466
Search in Google Scholar Back to article
[15] LEUNG Y.H., HE Z.B., LUO L.B., TSANG C.H.A., WONG N.B., ZHANG W.J., LEE S.T., Appl. Phys. Lett., 96 (2010), 053102.10.1063/1.3299269
Search in Google Scholar Back to article
[16] HE J.H., HSU J.H., WANG C.W., LIN H.N., CHEN L.J., WANG Z.L., J. Phys. Chem. B., 110 (2006), 50.10.1021/jp055180j
Search in Google Scholar Back to article
[17] SUN X.W., HUANG J.Z., WANG J. X., XU Z., Nano Lett., 8 (4) (2008), 1219.10.1021/nl080340z
Open DOI Search in Google Scholar Back to article
[18] BILGE OCAK S., SELÇUK A.B., ARAS G., ORHAN E., Mat. Sci. Semicon. Proc., 38 (2015), 249.10.1016/j.mssp.2015.04.030
Search in Google Scholar Back to article
[19] SELÇUK A.B., BILGE OCAK S., ARAS F.G., OZ ORHAN E., J. Electron. Mater., 43 (2014), 3263.10.1007/s11664-014-3267-2
Open DOI Search in Google Scholar Back to article
[20] SCHULZ M., KLAUSMANN E., J. Appl. Phys., 18 (1979), 169.10.1007/BF00934412
Open DOI Search in Google Scholar Back to article
[21] KONOFAOS N., MC CLEAN I.R., THOMAS C.B., Phys. Status Solidi A., 161 (1997), 111.10.1002/1521-396X(199705)161:1<;111::AID-PSSA111>3.0.CO;2-U
Search in Google Scholar Back to article
[22] BILGE OCAK S., SELÇUK A.B., ARAS G., ORHAN E., Mat. Sci. Semicon. Proc., 38 (2015), 249.10.1016/j.mssp.2015.04.030
Search in Google Scholar Back to article
[23] AFANDIYEVA I.M., ASKEROV SH.G., ABDULLAYEVA L.K., ASLANOW SH.S., Solıd State Electron., 51 (2007), 1096.10.1016/j.sse.2007.05.021
Open DOI Search in Google Scholar Back to article
[24] FARUK YÜKSEL Ö., SELCUK A.B., OCAK S.B., Vacuum, 82 (2008), 1183.10.1016/j.vacuum.2008.02.002
Search in Google Scholar Back to article
[25] SYMTH C.P., Dielectric Behaviour and Structure, McGraw-Hill, New York, 1995.
Search in Google Scholar Back to article
[26] POPESCU M., BUNGET I., Physics of Solid Dielectrics, Elsevier, Amsterdam, 1984.
Search in Google Scholar Back to article
[27] KWA K.S., CHATTOPADHYAY S., JANCOVIC N.D., OLSEN S.H., DRISCOLL L.S., O’NIELL A.G., Semicond. Sci. Tech., 18 (2003), 82.10.1088/0268-1242/18/2/303
Search in Google Scholar Back to article
[28] FAIVRE A., NIQUET G., MAGLIONE M., FORNAZERO J., LAI J.F., DAVID L., Eur. Phys. J. B, 10 (1999), 277.10.1007/s100510050856
Search in Google Scholar Back to article
[29] PISSIS P., KIRITSIS A., Solid State Ionics, 97 (1997), 105.10.1016/S0167-2738(97)00074-X
Open DOI Search in Google Scholar Back to article
[30] MIGAHED M.D., ISHRA M., FAHMY T., BARAKAT A., J. Phys. Chem. Solids, 65 (2004), 1121.10.1016/j.jpcs.2003.11.039
Open DOI Search in Google Scholar Back to article
[31] CHATTOPHADHYAY A., RAYCHAUDHURI B., Solid State Electron., 35 (1992), 875.10.1016/0038-1101(92)90290-S
Search in Google Scholar Back to article

Articles in this issue

DOI: https://doi.org/10.1515/msp-2017-0108 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331

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Language: English

Page range: 885 - 892

Submitted on: Jul 26, 2017

Accepted on: Dec 7, 2017

Published on: Mar 20, 2018

Published by: Wroclaw University of Science and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

electrical conductivity

Related subjects:

Materials sciences,

Materials sciences, other,

Nanomaterials,

Functional and smart materials,

Materials characterization and properties

© 2018 A.H. Selçuk, E. Orhan, S. Bilge Ocak, A.B. Selçuk, U. Gökmen, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Volume 35 (2017): Issue 4 (December 2017)