XRD pattern of Bi2O2.75 thin film.
The surface morphology (SEM) of Bi2O2.75 thin film.
Table 1
Percentage elemental composition of the Bi2O2.75 thin film and bare glass.
| Element | Bare glass | Bismuth oxide (Bi2O2.75) |
|---|---|---|
| Na | 9.02 | 5.14 |
| Mg | 2.26 | 1.37 |
| Al | 0.72 | 0.49 |
| Si | 35.10 | 29.46 |
| K | 0.21 | – |
| Ca | 5.63 | 5.78 |
| O | 47.06 | 19.21 |
| Bi | – | 38.56 |
Transmittance T [%] and reflectivity R [%] of Bi2O2.75 thin film versus wavelength.
Absorbance of Bi2O2.75 thin film versus wavelength.
Plot of (αhυ)2 versus hυ for Bi2O2.75 thin film.
Refractive index (nr) and extinction coefficient (k) of Bi2O2.75 thin film versus wavelength.
Variation of the real and imaginary parts of dielectric constant for the Bi2O2.75 thin film versus wavelength.
Table 2
Surface tension of test liquids used in the experiments.
| Liquid | γ [mN/m] |
|---|---|
| Water | 72.8 |
| Glycerin | 64 |
| Ethylene glycol | 48 |
| Iodometane | 35.27 |
Contact angel plot of the test liquids on the Bi2O2.75 thin film.