Abstract
In this work, a signal transformation method to quantitatively analyze fine magnetic structures in nanometer length scales measured by magnetic force microscopy has been developed. Nanosized magnetic domains, magnetic charges with reconstructed polarity as well as quantified magnetic field contours of samples (such as ordered FePt dot arrays, hard magnetic thin films and polycrystalline La0.7Sr0.3 MnO3 (LSMO) films ) were investigated based on the basic principles of deconvolution and micromagnetics. The present technique is crucial for the analysis of fine magnetic structures, and is important for the development of next generation magnetic recording industry.