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Microstructural, optical and electrical properties of Cl-doped CdTe single crystals

Open Access
|Sep 2016

Figures & Tables

Fig. 1

Four CdTe ingots used in this study: un-doped, doped with Cl at concentrations of 4.97 × 1019 cm−3, 9.94 × 1019 cm−3 and 1.99 × 1020 cm−3.
Four CdTe ingots used in this study: un-doped, doped with Cl at concentrations of 4.97 × 1019 cm−3, 9.94 × 1019 cm−3 and 1.99 × 1020 cm−3.

Fig. 2

XRD measurement results of 12 samples from four ingots with different Cl doping concentrations, chosen from top, middle and bottom sections, respectively.
XRD measurement results of 12 samples from four ingots with different Cl doping concentrations, chosen from top, middle and bottom sections, respectively.

Fig. 3

Typical IR microscope images of Te inclusions for three samples with Cl doping concentrations of 4.97 × 1019 cm−3, 9.94 × 1019 cm−3 and 1.99 × 1020 cm−3. The solid lines appearing on the surfaces might be due to the scratches induced by incompletely optimized polishing processes.
Typical IR microscope images of Te inclusions for three samples with Cl doping concentrations of 4.97 × 1019 cm−3, 9.94 × 1019 cm−3 and 1.99 × 1020 cm−3. The solid lines appearing on the surfaces might be due to the scratches induced by incompletely optimized polishing processes.

Fig. 4

Histogram of Te inclusions size distribution for three Cl-doped CdTe samples.
Histogram of Te inclusions size distribution for three Cl-doped CdTe samples.

Fig. 5

(a) Dielectric response curves of undoped and doped (1.99 × 1020 cm−3) CdTe sample, (b) α2vs. photon energy (hν, in eV) with extrapolation of the linear part of the curves to α = 0, (c) second derivative plots of ε1 shown in Fig. 5a.
(a) Dielectric response curves of undoped and doped (1.99 × 1020 cm−3) CdTe sample, (b) α2vs. photon energy (hν, in eV) with extrapolation of the linear part of the curves to α = 0, (c) second derivative plots of ε1 shown in Fig. 5a.

Fig. 6

(a) Average resistivities of CdTe samples as a function of Cl doping concentrations. Solid fitting line was provided as a guide for the eyes; (b) average resistivities of CdTe samples from different locations within the ingots (Fig. 1). Solid fitting line was provided as a guide for the eyes.
(a) Average resistivities of CdTe samples as a function of Cl doping concentrations. Solid fitting line was provided as a guide for the eyes; (b) average resistivities of CdTe samples from different locations within the ingots (Fig. 1). Solid fitting line was provided as a guide for the eyes.

Average resistivities of the CdTe samples with different Cl doping concentrations and different positions within the ingots_ Mean values for each row/column were also calculated and presented in the Table_

Top [Ω·cm]Middle [Ω·cm]Bottom [Ω·cm]Mean [Ω·cm]
Undoped5.20 × 1041.33 × 1041.60 × 1042.71 × 104
Cl doped, 4.97 × 1019cm−33.56 × 1065.70 × 1092.07 × 1092.59 × 109
Cl doped, 9.94 × 1019cm−31.06 × 1098.03 × 1093.35 × 1094.15 × 109
Cl doped, 1.99 × 1020cm−32.19 × 1091.44 × 10102.11 × 1096.22 × 109
Mean [Ω·cm]8.15 × 1087.02 × 1091.88 × 109
DOI: https://doi.org/10.1515/msp-2016-0066 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 487 - 493
Submitted on: Jun 17, 2015
Accepted on: May 17, 2016
Published on: Sep 8, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2016 Hyojeong Choi, Han Soo Kim, Joon-Ho Oh, Dong Jin Kim, Young Soo Kim, Jong-Seo Chai, Jang Ho Ha, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.