Rietveld refinement on XRD and TEM study of nanocrystalline PbZr0:5Ti0:5O3 ceramics prepared with a soft chemistry route
By: T.K. Mandal
References
- [1] JAFFE B., COOK W.R., JAFFE H, Piezoelectric Ceramics, Academic Press, London, 1971, pp. 123 - 238.
- [2] UCHINO K., Acta Mater., 46 (1998), 3745.
- [3] FUNAKUBO H., ARATANI M., OIKAWA T., TOKITA K., SAITO K., J. Appl. Phys., 92 (2002), 6768.
- [4] ROELOFS A., SCHNELLER T., SZOT K., WASER R., Nanotechnology, 14 (2003), 250.
- [5] MANDAL T.K., RAM S., Mater. Lett., 57 (2003), 2432.
- [6] MANDAL T.K., Appl. Phys. Lett., 89 (2006), 034103.
- [7] SACHDEVA A., ARORA M., TANDON R.P., J. Nanosci. Nanotechno., 9 (2009), 6631.
- [8] MORITA T., Materials, 3 (2010), 5236.
- [9] CHAMOLA A., SINGH H., NAITHANI U.C., SHARMA S., PRABHAT U., DEVI PRATIKSHA., MALIK A., SRIVASTAVA A., SHARMA R.K., Adv. Mater. Lett. 2 (2011), 26.
- [10] MISRI I., HAREESH P., YANG S Y., DEVOE D.L., J. Micromech. Microeng., 22 (2012), 085017.
- [11] MANDAL T.K., Indian J. Phys., 86 (2012), 818.
- [12] SRIVASTAVAN G., GOSWAMI A., UMARJI A.M., Ceram. Int., 39 (2013), 1977.
- [13] RAGINI, MISHRA S.K., PANDEY D., Phys. Rev. B., 64 (2001), 054101.
- [14] NOHEDA B., GONJALO J.A., CROSS L.E., GUO R., PARK S.E., COX D.E., SHIRANE G., Phys. Rev. B., 61 (2000), 8687.
- [15] KLEE M., VEIMAN A.D., WASER R., BRAND W., HAL H.V., J. Appl. Phys., 72 (1992), 1566.
- [16] GOLDBERG R.L., SMITH S.W., IEEE T. Ultrason. Ferr., 41 (1994), 761.
- [17] KONG L.B., MA J., ZHANG R.F., ZHU W., TAN O.K., Mater. Lett., 55 (2002), 370.
- [18] HAMMER M., HOFFMANN M.J., BARETZKY B.J., J. Eur. Ceram. Soc., 1 (1996), 161.
- [19] SAHA S.K., AGARWAL D.C., Am. Ceram. Soc. Bull., 71 (1992), 1424.
- [20] SOROWIAK Z., KUPRIYANOV M.F., CZEKAJ D.J., J. Eur. Ceram. Soc., 21 (2001), 1377.
- [21] ZENG J., SONG S., WANG L., ZHANG M. Z., ZHENG L., LIN C., J. Am. Ceram. Soc., 82 (1999), 461.
- [22] WU A., VILARINHO P.M., SALVADO I.M.M., BAPTISTA J.L., J. Am. Ceram. Soc., 83 (2000), 1379.
- [23] MALIC B., KOSEC M., J. Sol-gel Sci. Techn., 2 (1994), 443.
- [24] KLUG M.P., L.E. ALEXANDER, X-ray Diffraction Procedure for Polycrystalline and Amorphous Materials, Wiley, New York, 1974. p. 634.
- [25] RAGINI, RANJAN R., MISHRA S.K., PANDEY D., J. Appl. Phys., 92 (2002), 3266.
- [26] JCPDS X-ray powder diffraction file, 861710, Hexagonal PbZr0:75Ti0:25O3.
- [27] MEGAW H.D., DARLINGTON C.N.W., Acta. Crystallogr. A, 31 (1975), 161.
- [28] PARK H.B., PARK C.Y., HONG Y.S., KIM K., KIM S.J., J. Am. Ceram. Soc., 82 (1999), 94.
- [29] SHAO Q., LI A., LING H., WU D., WANG Y., MING N., Mater. Lett., 50 (2001), 32.
- [30] JCPDS X-ray powder diffraction file, 33-0784, Tetragonal PbZr0:52Ti0:48O3.
- [31] NASAR R.S., CERQUEIRA M.C., LONGO E.L., LEITE E.R., VARELA J.A., ANDRES B.J., J. Mater. Sci., 34 (1999), 3659.
- [32] LUCKS I., LAMPARTER P., MITTEMEIJER E.J., J. Appl. Cryst., 37 (2004), 300.
- [33] MANDAL T.K., Mater. Lett., 61 (2007), 850.
- [34] BEGG B.D., VANCE E.R., NOWOTNY J., J. Am. Ceram. Soc., 77 (1994), 3186.
- [35] AYYUB P., Phys. Edun., 1 (1998) 309.
DOI: https://doi.org/10.1515/msp-2015-0040 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Language: English
Page range: 18 - 24
Submitted on: Sep 10, 2013
Accepted on: Jan 16, 2015
Published on: Mar 13, 2015
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
Related subjects:
© 2015 T.K. Mandal, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.