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Editorial – Special Issue on Total Survey Error (TSE) Cover

Editorial – Special Issue on Total Survey Error (TSE)

Open Access
|Jun 2017

Authors

Stephanie Eckman

seckman@rti.org

RTI International, Washington, United States of America

Edith de Leeuw

e.d.deleeuw@uu.nl

Department of Methodology & Statistics, Utrecht University, Utrecht, Netherlands
Language: English
Page range: 301 - 301
Published on: Jun 12, 2017
Published by: Sciendo
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2017 Stephanie Eckman, Edith de Leeuw, published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.