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Security Problems of Scan Design and Accompanying Measures Cover

Security Problems of Scan Design and Accompanying Measures

Journal of Electrical Engineering
Volume 67 (2016): Issue 3 (May 2016)
By: Anton Biasizzo and  Franc Novak  
Open Access
|Jun 2016
Articles in this issue
DOI: https://doi.org/10.1515/jee-2016-0027 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 192 - 198
Submitted on: Jul 2, 2015
Published on: Jun 28, 2016
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
test structures,
boundary-scan test,
security
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2016 Anton Biasizzo, Franc Novak, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Volume 67 (2016): Issue 3 (May 2016)
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