Maximum Temperature Detection System for Integrated Circuits

Frankiewicz, Maciej; Kos, Andrzej

doi:10.1515/jee-2015-0012

Abstract

The paper describes structure and measurement results of the system detecting present maximum temperature on the surface of an integrated circuit. The system consists of the set of proportional to absolute temperature sensors, temperature processing path and a digital part designed in VHDL. Analogue parts of the circuit where designed with full-custom technique. The system is a part of temperature-controlled oscillator circuit - a power management system based on dynamic frequency scaling method. The oscillator cooperates with microprocessor dedicated for thermal experiments. The whole system is implemented in UMC CMOS 0.18 μm (1.8 V) technology.

References

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Maximum Temperature Detection System for Integrated Circuits

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