References
- [1] Helmke C, Jantsch M, Ossenbrink HA. An assessment of the results of calibrating 600 silicon PV reference devices. Proc. 13th European Photovoltaic Solar Energy Conference and Exhibition, Nice 1995, 2319-2323. DOI: 10.1109/PVSC.1996.564363.
- [2] Lorenz D, Backus C. A new technique for predicting silicon solar cell short-circuit currents at reference irradiance conditions. Proc. 15th IEEE Photovoltaic Specialist Conference. Orlando, FL. 1981.
- [3] Gueymard C. SMARTS2, Simple Model of the Atmospheric Radiative Transfer of Sunshine: Algorithms and performance assessment, Rep. FSEC-PF-270-95, Florida Solar Energy Center, Cocoa, FL 1995. http://www.fsec.ucf.edu/en/publications/pdf/FSEC-PF-270-95.pdf.
- [4] Gueymard C. SMARTS2. http://alpha.fsec.ucf.edu/public/smarts2/ or http://homepage.mac.com/cgueymard.
- [5] IEC 60904-3: Measurement principles for terrestrial photovoltaic (PV) solar device with reference spectral irradiance data. 1995. https://webstore.iec.ch/publication/3875.
- [6] Żdanowicz T, Rodziewicz T, Ząbkowska-Wacławek M. Zastosowanie ogniw krzemowych w systemach fotowoltaicznych do pomiaru nasłonecznienia i rzeczywistej temperatury modułów (Application of silicon cells in photovoltaic systems to measurements of insolation and real temperature of modules). Chem Inż Ekol. 1998;5(1-2):91-100.