Attendance Numbers at SI Sessions and Their Effect on Learning Conditions
Journal eISSN: 2200-2359
Language: English
Page range: 21 - 35
Published on: Dec 22, 2020
Published by: Virginia Tech Publishing
In partnership with: Paradigm Publishing Services
Keywords:
© 2020 Johan Fredriksson, Joakim Malm, Arthur Holmer, Lassana Ouattara, published by Virginia Tech Publishing
This work is licensed under the Creative Commons Attribution 4.0 License.