Double Standards: An Empirical Study of Patent and Trademark Discipline
By: Jon J. Lee
Open Access
|May 2020Authors
Journal eISSN: 1930-661X
Language: English
Page range: 1614 - 1686
Published on: May 29, 2020
Published by: Boston College Law School
In partnership with: Paradigm Publishing Services
© 2020 Jon J. Lee, published by Boston College Law School
This work is licensed under the Creative Commons License.