Authors
Illapha G.L. Cuba Gyllensten
illapha.cuba.gyllensten@philips.com
Philips Research, Netherlands, The Technical University Eindhoven, Eindhoven, The Netherlands
Kevin M. Goode
illapha.cuba.gyllensten@philips.com
University of Hull, Kingston-Upon-Hull, United Kingdom
Oliver Amft
illapha.cuba.gyllensten@philips.com
Technical University Eindhoven, Eindhoven, The Netherlands
